YH

Yoshihiro Hashimoto

AD Advantest: 3 patents #13 of 141Top 10%
Overall (2002): #18,222 of 266,432Top 7%
3
Patents 2002

Issued Patents 2002

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6492831 Current measuring method and current measuring apparatus 2002-12-10
6404220 IC testing method and IC testing device using the same 2002-06-11
6391667 Power supply unit, semiconductor device testing apparatus and semiconductor device testing method 2002-05-21