Issued Patents 2002
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6498998 | Method and apparatus for testing a semiconductor device | — | 2002-12-24 |
| 6404371 | Waveform generator and testing device | Takeshi Takahashi, Masayuki Kawabata | 2002-06-11 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6498998 | Method and apparatus for testing a semiconductor device | — | 2002-12-24 |
| 6404371 | Waveform generator and testing device | Takeshi Takahashi, Masayuki Kawabata | 2002-06-11 |