Issued Patents 2002
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6460001 | Apparatus for and method of measuring a peak jitter | Takahiro Yamaguchi, Masahiro Ishida | 2002-10-01 |
| 6423558 | Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures | Yasuhiro Maeda, Masahiro Ishida, Takahiro Yamaguchi | 2002-07-23 |
| 6400129 | Apparatus for and method of detecting a delay fault in a phase-locked loop circuit | Takahiro Yamaguchi, Masahiro Ishida | 2002-06-04 |