RI

Robert E. Steere, III

AU Accretech Usa: 1 patents #1 of 2Top 50%
📍 Boonton, NJ: #2 of 12 inventorsTop 20%
🗺 New Jersey: #1,736 of 5,778 inventorsTop 35%
Overall (2002): #125,638 of 266,432Top 50%
1
Patents 2002

Issued Patents 2002

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6473987 Method for measuring wafer thickness Colby Steere 2002-11-05