Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4857839 | Method and apparatus for measuring average resistivity and hall-effect of semiconductor wafers | David C. Look | 1989-08-15 |
| 4816755 | Method and apparatus for measuring photoresistivity and photo hall-effect of semiconductor wafers | David C. Look | 1989-03-28 |