Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4875175 | Method and device for analyzing and measuring physical parameters of a layered material by thermal radiometry | Michel Egee, Robert Dartois, Jean Marx, Etienne Merienne, Marcel Regalia +1 more | 1989-10-17 |