Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4854710 | Method and apparatus for evaluating surface and subsurface features in a semiconductor | Jon Opsal, Walter Lee Smith | 1989-08-08 |
| 4795260 | Apparatus for locating and testing areas of interest on a workpiece | John Schuur, David L. Willenborg, Michael W. Taylor | 1989-01-03 |