Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4850710 | Method of measuring and displaying double refraction occurring in a material to be measured | Yoshihiro Mochida, Ichiro Shirahama, Naoshi Kiyomoto | 1989-07-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4850710 | Method of measuring and displaying double refraction occurring in a material to be measured | Yoshihiro Mochida, Ichiro Shirahama, Naoshi Kiyomoto | 1989-07-25 |