MF

Michael E. Fein

TI Tencor Instruments: 2 patents #1 of 6Top 20%
KI Kla Instruments: 1 patents #2 of 20Top 10%
SP Spectra-Physics: 1 patents #23 of 64Top 40%
📍 Toledo, OH: #2 of 87 inventorsTop 3%
🗺 Ohio: #54 of 3,574 inventorsTop 2%
Overall (1989): #4,277 of 140,708Top 4%
4
Patents 1989

Issued Patents 1989

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
4877326 Method and apparatus for optical inspection of substrates Curt H. Chadwick, Robert R. Sholes, John D. Greene, Francis D. Tucker, III, P. C. Jann +2 more 1989-10-31
4877997 High brightness and viewed gas discharge lamp 1989-10-31
4852983 Distance simulator 1989-08-01
4844617 Confocal measuring microscope with automatic focusing Herman F. Kelderman, Alan E. Loh, Arnold Adams, Armand P. Neukermans 1989-07-04