SI

Shinichi Iwashita

NE Nec: 1 patents #128 of 619Top 25%
Overall (1989): #57,728 of 140,708Top 45%
1
Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4870618 Semiconductor memory equipped with test circuit for testing data holding characteristic during data programming period 1989-09-26