HW

Hans-Heinrich Willberg

MG Multitest Elektronische Systeme Gmbh: 1 patents #1 of 2Top 50%
Overall (1989): #26,408 of 140,708Top 20%
2
Patents 1989

Issued Patents 1989

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
4889242 Device for testing and sorting electronic components, more particularly integrated circuit chips Ekkehard Ueberreiter 1989-12-26
4857838 Apparatus for testing electronic components, in particular IC's 1989-08-15