Issued Patents 1989
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4888715 | Semiconductor test system | Hideo Matsui | 1989-12-19 |
| 4873686 | Test assist circuit for a semiconductor device providing fault isolation | Tsuyoshi Yamada | 1989-10-10 |
| 4813043 | Semiconductor test device | Hideshi Maeno | 1989-03-14 |
| 4807229 | Semiconductor device tester | — | 1989-02-21 |
| 4801871 | Testing apparatus for semiconductor device | Hideshi Maeno | 1989-01-31 |
| 4799009 | Semiconductor testing device | Keisuke Okada | 1989-01-17 |