Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4801878 | In-circuit transistor beta test and method | Ronald J. Peiffer | 1989-01-31 |
| 4799023 | Circuits and apparatus which enable elimination of setup time and hold time testing errors | Kamran Firooz, Vance R. Harwood, Robert C. Illick, Jr. | 1989-01-17 |