MK

Murlidhar V. Kulkarni

IBM: 1 patents #253 of 1,444Top 20%
📍 Fishkill, NY: #8 of 18 inventorsTop 45%
🗺 New York: #1,258 of 5,342 inventorsTop 25%
Overall (1989): #74,327 of 140,708Top 55%
1
Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4844616 Interferometric dimensional measurement and defect detection method William H. Lancaster, Jr. 1989-07-04