Issued Patents 1989
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4803356 | Method and apparatus for measuring degree of vacuum in an electron microscope | Hiroki Kumahora, Eiichi Nishimura | 1989-02-07 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4803356 | Method and apparatus for measuring degree of vacuum in an electron microscope | Hiroki Kumahora, Eiichi Nishimura | 1989-02-07 |