YF

Yoshihito Fukasawa

KT Kabushiki Kaisha Toshiba: 1 patents #376 of 1,409Top 30%
📍 Tokyo, WA: #13 of 26 inventorsTop 50%
Overall (1989): #41,342 of 140,708Top 30%
1
Patents 1989

Issued Patents 1989

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4874956 Method and apparatus for inspecting semiconductor devices for their bonding status Toshihiro Kato, Masamichi Shindo 1989-10-17