Issued Patents 1989
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4862071 | High speed circuit testing apparatus having plural test conditions | Kazuhiko Sato, Keiichi Takahashi | 1989-08-29 |
| 4835774 | Semiconductor memory test system | Hiromi Ooshima, Masao Shimizu | 1989-05-30 |