Issued Patents 1982
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4352016 | Method and apparatus for determining the quality of a semiconductor surface | Michael Duffy | 1982-09-28 |
| 4352017 | Apparatus for determining the quality of a semiconductor surface | Michael Duffy, John F. Corboy, Jr. | 1982-09-28 |