Issued Patents 1982
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4360269 | Apparatus for inspecting defects in a periodic pattern | Hidekazu Sekizawa | 1982-11-23 |
| 4330775 | Apparatus for inspecting defects in a periodic pattern | Hidekazu Sekizawa | 1982-05-18 |