Issued Patents 1982
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4355232 | Apparatus for measuring specimen potential in electron microscope | Satoru Fukuhara, Yoshio Sakitani | 1982-10-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4355232 | Apparatus for measuring specimen potential in electron microscope | Satoru Fukuhara, Yoshio Sakitani | 1982-10-19 |